Industry-standard platform, RF-grade measurement science
We develop on the industry-standard ATE platforms our customers already run in production.
Industry-standard SoC and RF test platforms
We work on the high-end SoC, mixed-signal and RF ATE platforms that leading semiconductor companies use in production. Our founders have deployed these systems in volume production at sites in the United States, Singapore and Taiwan.
Programs are developed for the platform the customer already runs, so they transfer straight into production with no re-work, whether testing is done in-house or at an OSAT.
Test program development
- Test program development and debugging in the platform's native environment
- Offline development, so program work starts before silicon arrives
- Characterization, shmoo and data-logging flows
- Structured, documented programs that are easy to maintain and transfer
Most of the engineering happens before the first insertion
Simulation shortens bring-up and protects RF performance. These are the workflows our engineers use.
Offline program development
Programs are written and checked against the test plan offline, so time on silicon goes to measurement, not debugging.
Load-board co-simulation
Circuit and electromagnetic simulation of the load board and socket path, to keep loss and mismatch within budget.
De-embedding models
Fixture models that move the measurement reference plane from the instrument port to the device pins.
Correlation analytics
Statistical comparison of bench and ATE data, and of test sites, to set limits and guard-bands you can defend.
Test-time modeling
Models of instrument settling, multisite parallelism and test order, so cost per device is designed in.
Characterization planning
Design-of-experiment plans across voltage, temperature and process that find the corners early.
Want to see how we would test your device?
We can walk you through a test strategy for your part: instruments, load board, correlation plan and estimated test time.